In most digital signal processors, multipliers serve as crucial components, significantly impacting system performance based on their throughput. In modern technology nodes, reliability has become a critical design consideration. Transistor aging adversely affects system performance over time, potentially leading to delayrelated failures, with the impact of aging intensifying as transistor size scales down. Bias Temperature Instability (BTI) is a primary cause of transistor aging, leading to an increase in threshold voltage over time and a consequent reduction in multiplier speed. Although over-design approaches can mitigate aging effects, they often result in power and area inefficiencies. Fixed latency designs are prone to timing violations, making variable latency multipliers preferable for reliable operation under BTI effects. Adaptive Hold Logic (AHL) is utilized to appropriately select the cycle period, while an Error Detection and Correction Pulsed Latch (ECPL) is employed to detect timing errors.