DFT–BIST FRAMEWORK FOR ENHANCING SECURITY AND RELIABILITY OF VLSI SYSTEMS IN HYBRID MODE. International Journal of Food and Nutritional Sciences, [S. l.], v. 11, n. 13, p. 4161–4169, 2022. Disponível em: https://ijfans.org/index.php/Journal/article/view/8031. Acesso em: 18 jul. 2026.